February 28th, 2010 at 10:45 pm » Comments (0)

DESCRIPTION OF TECHNIQUE Atomic force microscopy (AFM) is a form of scanning probe microscopy (SPM), where a small probe is scanned across the sample to obtain information on the sample surface. ...more »

February 28th, 2010 at 3:00 pm » Comments (0)

DESCRIPTION OF TECHNIQUE Auger Electron Spectroscopy (AES) provides information on the chemical composition of the outer material that includes a solid surface or interface. The main advantages of AES over other ...more »

February 28th, 2010 at 2:54 pm » Comments (0)

DESCRIPTION OF TECHNIQUE Energy Dispersive X-Ray Spectroscopy (EDS or EDX) is a technique used in conjunction with chemical microanalysis by scanning electron microscopy (SEM). (See Manual SEM.) EDS technique detects X-rays ...more »